Thickness-dependent Film Resistance of Thin Porous Film

STUDY OF THICKNESS DEPENDENT CHARACTERICTICS OF Cu2S THIN FILM FOR VARIOUS APPLICATIONS

Abstract: Different thickness of Cu2S thin films were prepared by vacuum evaporation under a pressure of 10-6 torr at an evaporation rate of 3Å /sec. Cu2S has direct band gap energy and indirect band gap energy at 1.2eV and 1.8 eV respectively. This paper presents the analysis of structural and optical properties of the Cu2S thin film by X-ray diffractometer (XRD) and UV-Vis-NIR Spectrophotomet...

Thickness-dependent mobility in tetracene thin-film field-effect-transistors

Thin Film Evolution over a Thin Porous Layer: Modeling a Tear Film on a Contact Lens

We examine a mathematical model describing the behavior of the precontact lens tear film of a human eye. Our work examines the effect of contact lens thickness and lens permeability on the film dynamics. Also investigated are gravitational effects and the effects of different slip models at the fluid-lens interface. A mathematical model for the evolution of the tear film is derived using a lubr...

Thickness Dependence of Sensitivity in Thin Film Tin Oxide Gas Sensors Deposited by Vapor Pyrolysis

Transparent SnO2 thin films were deposited on porcelain substrates using a chemical vapor deposition technique based on the hydrolysis of SnCl4 at elevated temperatures. A reduced pressure self-contained evaporation chamber was designed for the process where the pyrolysis of SnCl4 at the presence of water vapor was carried out. Resistive gas sensors were fabricated by providing ohmic contacts o...

Advanced Multilayer Amorphous Silicon Thin-Film Transistor Structure: Film Thickness Effect on Its Electrical Performance and Contact Resistance

We report the intrinsic and extrinsic electrical characteristics of advanced multilayer amorphous silicon (a-Si:H) thin-film transistor (TFT) with dual amorphous silicon nitride (a-SiNX:H) and a-Si:H layers. The thickness effect of the high electronic quality a-Si:H film on the transistor’s electrical property was investigated; with increasing film thickness, both field-effect mobility and subt...